Reaching new heights in scanning optical microscopy
Advancing High-Speed Scanning in Optical Microscopy Many industrial applications demand rapid microscopic specimen scanning without any delay in image acquisition. By pairing […]
Improving Reflected Darkfield Microscopy Imaging
Improving Illumination Uniformity in Reflected Darkfield Microscopy The ability of reflected darkfield microscopy to reveal outlines, edges, boundaries, scratches, pinholes and refractive […]
IC Crack and Vent Imaging use SWIR Modular Microscope System
Seeing Beneath the Surface: SWIR Imaging for IC Inspection Crack and vent defects often result during the integrated circuit (IC) manufacturing process, […]
WDI Unveils New Modular SWIR Microscope and Illuminators
WDI, a leader in advanced microscopy automation technology, today announced the launch of its new modular short-wave infrared (SWIR) microscope system and […]