WDI Introduces the PFA-LN: Advanced Autofocus Featuring Multi-Segment Processing

WDI proudly introduces the PFA-LN, a next-generation autofocus solution designed to meet the most demanding microscopy applications. Featuring Advanced Multi-Segment Processing, this innovative technology enhances adaptive autofocus performance on complex, patterned, and multilayer samples—making it an ideal solution for semiconductor wafers, OLED applications, and beyond.

Key Features and Benefits:

• 30-degree line rotation to optimize focus on patterned surfaces.
• Gigabit Ethernet communication for enhanced integration and real-time analytics, more reliable performance.
• Up to 3 KHz sample rate and improved processing power enhance high-speed tracking performance , offering the fastest autofocus solution available today.
• Integrated advanced surface recognition functionality for consistent, high-speed focus on challenging surfaces.
• Compatibility with various Z motion systems, including Piezo actuators, Dover Motion’s DOF-5, WDI’s integrated Z stage, and third-party Z-axis stages.
• Real-time diagnostics and performance reporting with insightful analytics and statistical metrics.