Advancing High-Speed Scanning in Optical Microscopy

Many industrial applications demand rapid microscopic specimen scanning without any delay in image acquisition. By pairing area scan cameras with high-speed illuminators that generate ultra-short light pulses, systems can effectively “freeze” motion capturing sharp images even while specimens move continuously relative to the microscope. Achieving this requires light pulses that are both extremely short and highly intense.

Until recently, arc-guided Xe strobe lamps were the only light sources capable of meeting these demanding requirements. However, their limited-service life often just a few months in 24/7 industrial environments creates frequent maintenance and replacement challenges.

To address this issue, WDI has developed RGB Fast Pulse High Power LED Reflected Brightfield illuminator.  This patent pending solution substitutes mid-power arc guided Xe strobe lamps with long service life light engines in microscope Reflected Bright Field illuminators.

Below is Si microscope test target sample Bright Field image, acquired with WDI PFA LN Modular Microscope System (MMS), equipped with Fast Pulse High Power LED Reflected Brightfield illuminator, monochrome camera with pixel size p=3.45 µm and 10X/0.28 objective.

The light pulse duration was set at τ = 1.1 µsec, the illuminator was working at ~ 50% of its maximum emitted light intensity.