The ability of reflected darkfield microscopy to reveal outlines, edges, boundaries, scratches, pinholes and refractive index gradients makes it a valuable imaging […]

Crack and vent defects often result during the integrated circuit (IC) manufacturing process, particularly after wafer dicing.  Detection and classification may be […]

WDI, a leader in advanced microscopy automation technology, today announced the launch of its new modular short-wave infrared (SWIR) microscope system and […]

WDI Introduces the PFA-LN: Advanced Autofocus Featuring Multi-Segment Processing WDI proudly introduces the PFA-LN, a next-generation autofocus solution designed to meet the […]

Today, WDI is thrilled to introduce to you the pre-launch of a groundbreaking addition to our product lineup that is set to […]

The views and opinions expressed in the interviews published on Made in CA are those of the interviewees and do not reflect […]

WDI is excited to introduce the PFA-DT, the latest addition to the world’s most powerful microscopy autofocus sensor. Driven by the demands […]

WDI has always prioritized the safety of our employees, customers and business partners, and in these uncertain times, this is no different. […]

WDI is excited to announce the integration of our ATF and PFA microscopy focus technology with the Dover Motion DOF-5 Linear Z […]

In response to developments around the COVID-19 pandemic, WDI has implemented measures to ensure business continuity while protecting the health of our […]