What Is the SWIR & VIS Modular Microscope System (MMS) and How Does It Work?

Short-wave infrared (SWIR) & Visible (VIS) Modular Microscope System (MMS) is WDI’s LED-based, next-generation microscopy platform built to deliver Short-wave infrared (SWIR) and visible light imaging in a single, compact package. It is used across various industries such as semiconductor manufacturing, electronics, and machine vision metrology, where inspecting surface features alone is no longer enough. WDI’s SWIR modular microscope system uses precision optics, stable LED illumination, and application-specific SWIR wavelengths that work together to reveal internal and buried features that visible light cannot expose, without sacrificing image quality on the surface.

These SWIR & VIS MMS Configurations Cover a Wide Scope of Applications

Single-Wavelength SWIR MMS: A focused configuration built around one of six selectable SWIR wavelengths (1150, 1200, 1300, 1370, 1450, 1550 nm) ideal for targeting the contrast characteristics of a specific material or feature types.

Broadband SWIR MMS: A wide-spectrum configuration (approximately 1150–1650 nm) that delivers high-contrast imaging across a broader range of materials, revealing buried structures and defects that a single wavelength may miss.

Dual-Mode SWIR & Visible MMS: A combined configuration that pairs SWIR and visible illumination through one single solution eliminating the need for separate illumination source or bulky external solutions.

Dual Camera MMS: A configuration with two camera ports, one visible and one SWIR, plus dual channel illumination, enables fast, simultaneous imaging of both surface and internal features.

These configurations have been developed to support a wide range of illumination choices, autofocus strategies, and inspection depths, making the SWIR MMS a versatile solution for any application that requires seeing beyond the surface. WDI’s modular components, including the PFA-LN autofocus sensor, Z Axis Stages, linear lens changers, and SWIR illuminators, are engineered to work together as a complete system while preserving the compact footprint, image quality, and reliability that define the MMS platform.

Key Applications of the SWIR & VIS MMS

The SWIR MMS is designed for demanding microscopy imaging applications in semiconductor and machine vision metrology, where SWIR illumination penetrates materials such as silicon to expose internal and buried features not revealed by visible illumination. When paired with WDI’s PFA-LN autofocus sensor and Optical Offset Adjuster (OOA), the system supports fast autofocus tracking of the surface while simultaneously imaging internal features at depth, giving a high-resolution picture of what’s happening below the surface without slowing down the inspection process.

Why Choose WDI Wise Device for Your SWIR Imaging Needs?

WDI Wise Device is a world leader in custom design, manufacturing, and integration of OEM and complete microscopy automation solutions for the biomedical, metrology, electronics, semiconductor, and flat panel display markets. By combining SWIR optimized optics, sensors, and illumination into one LED-based modular system, WDI transforms a standard imaging setup into a next-generation SWIR inspection platform with the image quality, stability, and flexibility that demanding metrology applications require.

WDI’s SWIR MMS components are available in single-wavelength, broadband, and dual-mode configurations, providing a consistent modular integration path from one reliable source. All configurations are customizable based on application requirements with or without an autofocus sensor, and it can also incorporate a camera bandpass filter, either a manually swappable single filter holder or a motorized filter wheel for automated applications. WDI components can also be integrated with compatible third-party components depending on the needs of each application.

Providing a complete range of OEM microscope automation components for building customized standalone SWIR imaging systems, WDI’s product line includes the PFA-LN autofocus sensor, integrated Z Axis Stages (iZAA-SO, iZAA-MO, and iZPS), linear lens changers (LLC2, LLC3, iLLC-SM, iLLC-LG), and SWIR and visible LED illuminators. Designed for flexibility and seamless integration, these components can be combined to create application-specific solutions.

SWIR MMS Examples

Why Integrate WDI’s SWIR & VIS MMS Into Your Inspection Platform?

Integrating WDI’s SWIR MMS OEM components helps maximize the performance and usability of any microscopy-based measurement platform, providing autofocus, illumination, Z Axis motion control, and system integration capabilities that improve workflow efficiency, imaging consistency, and ease of operation.

Image Quality: WDI’s MMS components are engineered specifically for both SWIR and visible light imaging, including matched optics, sensors, and illumination, delivering unmatched image quality and superior performance compared to retrofitted visible-light systems.

Speed: WDI’s PFA-LN autofocus sensors operate at a sampling rate of up to 3 kHz (Swift 5 kHz) using Gigabit Ethernet communication create the fastest autofocus solution available today.

Accuracy: The PFA-LN autofocus sensors deliver static autofocus repeatability of ±0.25 objective depth of field or better, and tracking autofocus repeatability of ±0.33 objective depth of field or better, helping maintain stable autofocus performance across complex, patterned, and multi-surface samples.

Stability: SWIR LED illuminators provide consistent, spectrally stable output and long-lasting performance, ensuring reproducible imaging over time while eliminating the need for halogen bulb replacement.

Flexibility: WDI’s illuminator, Z Axis Stage, and lens changer components can be configured with or without laser autofocus, and support single or dual-mode SWIR and visible illumination through a single optical package, avoiding the need for separate light sources or frequent reconfiguration.

Scalable Automation Platform: The modular design of WDI’s MMS components allows additional automation functions, such as a second camera port, filter wheel or additional Z Axis Stage travel to be added as application needs evolve, supporting scalable system development without a complete redesign.

SWIR Illuminator Options

A camera bandpass filter, available as a manually swappable holder or motorized filter wheel, adds selective wavelength filtering for broadband SWIR applications that require targeted contrast control.

Conclusion

WDI’s Short-wave infrared (SWIR) & visible (VIS) Modular Microscope Systems (MMS) give semiconductor and machine vision metrology users a compact, low maintenance way to see what visible light imaging alone cannot do. By combining SWIR LED based illumination, and WDI’s PFA-LN autofocus sensor into one modular platform, where the users gain a system capable of simultaneously tracking surface features while imaging structures at depth. The result is a scalable future ready SWIR imaging platform that improves inspection confidence and productivity across a wide range of industrial and research applications.